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Bit Error Rate Tester Fpga


http://altrea.com/literature/manual/rm si bd 2sgx90.pdf. [5] Hightech Global. On the generation session, the data active event is exported to the PFI 1 line, using the NI HSDIO Export Signal. Please try the request again. Get Help About IEEE Xplore Feedback Technical Support Resources and Help Terms of Use What Can I Access? check my blog

Synchronization For most digital tests performed on semiconductors, synchronization is a requirement, whether it is between the board and the DUT or even between generation and acquisition sessions. The DWE offers a configurable software environment for creating digital vectors. The system returned: (22) Invalid argument The remote host or network may be down. Use of this web site signifies your agreement to the terms and conditions.

Bit Error Rate Tester Agilent

Step 7: Once the set up is done, the NIHSDIO HWC Fetch Sample Errors can be used to fetch all the errors that occurred. Bookmark & Share Share Downloads Attachments: digital_bert_test.vi Ratings Rate this document Select a Rating 1 - Poor 2 3 4 5 - Excellent Answered Your Question? ScienceDirect ® is a registered trademark of Elsevier B.V.RELX Group Close overlay Close Sign in using your ScienceDirect credentials Username: Password: Remember me Not Registered? Using nested for loops, the locations of the errors are checked and stored in the shift registers.

Overview This document discusses the details of Bit Error Rate Testing (BERT) testing using National Instruments hardware and software. A use case of a deserializer would be for acquiring signals of speeds higher than the capabilities of existing hardware. Forgotten username or password? Bit Error Rate Test Equipment Learn more about our privacy policy.

Skip to content Journals Books Advanced search Shopping cart Sign in Help ScienceDirectSign inSign in using your ScienceDirect credentialsUsernamePasswordRemember meForgotten username or password?Sign in via your institutionOpenAthens loginOther institution loginHelpJournalsBooksRegisterJournalsBooksRegisterSign inHelpcloseSign Bit Error Rate Tester Software Step 1: To conduct the BERT test the acquisition and generation sessions on the digital board must be synchronized. This provides a cheaper alternative to dedicated table-top equipment and offers the flexibility of test customization and data analysis. The system returned: (22) Invalid argument The remote host or network may be down.

Some external connections need to be made to synchronize the generation and acquisition sessions. Bit Error Rate Test Set The system returned: (22) Invalid argument The remote host or network may be down. The easy to use NI-HSDIO driver can be used for programming the NI PXI-6552, for generation and acquisition, and the otherwise complex hardware compare feature. For the acquisition session, the sample clock should be set up to use the strobe line as its reference clock.

Bit Error Rate Tester Software

This is done for the large number of errors that occur. If this property is set to "Stimulus and Expected Response" or "Expected Response Only", the generation engine sends the expected data to the FIFO, to be compared with the acquired data. Bit Error Rate Tester Agilent The deserializer takes in fast serial data and outputs slower parallel data, thus making it easier to acquire the parallel data (on a higher number of channels). Bert Bit Error Rate Tester The NI PXI-6552, which is used for this demo, has features such as Hardware Compare, which perform on board comparisons between generated signals and acquired signals.

JINT 2009 4 P12003. [3] S. click site Your cache administrator is webmaster. Your cache administrator is webmaster. The deserializer accepts the serial stimulus data and outputs the expected data. Bit Error Rate Test

Back to Top 2. On the generation side the sample clock must be exported to the ClkOut pin on the Digital Data and Control Connector (DDC) by connecting the ClkOut pin on the Digital Data With the integration of high-speed transceivers inside a field programmable gate array (FPGA), the BER testing can now be handled by transceiver-enabled FPGA hardware. news The architecture of the tester is described.

Please try the request again. The pattern generator sends a bit stream (stimulus) to the device under test (DUT) which then responds back with another bit stream. To return to the DCParametric Testing Reference Architecture main page, click here.

Baron et al.

Please try the request again. Amaral et al. For this BERT test, it is important to synchronize the generation and acquisition sessions because hardware compare is used to check for bit errors that occur on the expected data. Help Direct export Save to Mendeley Save to RefWorks Export file Format RIS (for EndNote, ReferenceManager, ProCite) BibTeX Text Content Citation Only Citation and Abstract Export Advanced search Close This document

Yes No Submit This site uses cookies to offer you a better browsing experience. Figure 4: External connections on the NI PXI-6552 for synchronization To perform the test, the stimulus data (loaded on the on-board memory), is generated, and the expected data is stored in All rights reserved. | Site map × ERROR The requested URL could not be retrieved The following error was encountered while trying to retrieve the URL: Connection to failed. More about the author That would make more sense to me.

Your cache administrator is webmaster. In this example system, the NI-HSDIO driver is used to program the FPGA for hardware-compare. For more information, visit the cookies page.Copyright © 2016 Elsevier B.V. Software Setup The software used in this system is architected using NI LabVIEW and the NI Digital Waveform Editor.

Subscribe Personal Sign In Create Account IEEE Account Change Username/Password Update Address Purchase Details Payment Options Order History View Purchased Documents Profile Information Communications Preferences Profession and Education Technical Interests Need This sets up the device to compare expected data to actual in real time. The system returned: (22) Invalid argument The remote host or network may be down. Please try the request again.

Opens overlay Annie Xiang a, ⁎, [email protected], Opens overlay Datao Gong a, Opens overlay Suen Hou b, Opens overlay Chonghan Liu a, Opens overlay Futian Liang c, Opens overlay Tiankuan Liu Your cache administrator is webmaster. Figure 2 – Hardware Set up The stimulus data that can be seen in the diagram above can be created programmatically in a language such as NI LabVIEW, or an easy Stratix IV GXGT development platform, HTG-S4G-PCIE user manual. [6] D.

It also includes a computer interface for data acquisition and user configuration. The tester's functionality was validated and its performance characterized in a point-to-point serial optical link setup. Physics Procedia Volume 37, 2012, Pages 1667-1673 Proceedings of the 2nd International Conference on Technology and Instrumentation in Particle Physics (TIPP 2011)

Open Access Design and Verification of an FPGA-based Bit